method
Chips captured using less common methods
Pseudo-common methods maybe should get their own pages: * SEM * Darkfield
Short wave infrared (SWIR)
| Image | Vendor | ID | Author/setup | Notes |
|---|---|---|---|---|
 | Atmel | ataes132-mah-er-t | McMaster | Link |
 | Broadcom | bcm5976c1kub6g | bunnie | Link |
 | Broadcom | bcm59365 | bunnie | Link |
 | californiamicro | 65sc02 | bunnie | Link |
  | efabless | sky130-mpw7 | bunnie | Link |
 | Marvell | 88ap6bl02 | bunnie | Link |
 | Microchip | PIC12F609 | 4e71 | Link Has detailed setup pictures |
 | Mediatek | mt6331 | bunnie | Link |
 | NXP | imx6q | bunnie | Link |
 | rockwell | 65c02 | bunnie | Link |
 | seiko | s-35199a01 | PoroCYon | Link |
 | spacex | catson-v20 | Misc | Link |
Full list:
- bunnie:broadcom:bcm5976c1kub6g
- bunnie:broadcom:bcm59365
- bunnie:californiamicro:65sc02
- bunnie:efabless:sky130-mpw7-die1
- bunnie:marvell:88ap6bl02
- bunnie:mediatek:mt6331
- bunnie:nxp:imx6q
- bunnie:rockwell:65c02
- mcmaster:atmel:ataes132-mah-er-t
- misc:spacex:catson-v20
- porocyon:seiko:s-35199a01
| Vendor | ID | Thickness (um) | Notes |
|---|---|---|---|
| Atmel | ATSHA204 | 140 | Labsmore IR test |
| Samsung | K4H560838D | 300 | Labsmore IR test |
| Securid | 2C | 320 | Labsmore IR test |
| ST | STM32F107 | 400 | Labsmore IR test |
Confocal
method.txt · Last modified: 2025/08/04 21:24 by 127.0.0.1